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View inside a pointSEM electron microscope. You can see the point electronic electronics

Electronics, hardware, and software

An overview of the pointSEM components.

The electronics, hardware, and software of the pointSEM are perfectly coordinated and designed for maximum performance. The simultaneous acquisition of up to 20 image channels, short scan times, and high resolutions enable fast, precise image generation. Integrated automation, sensitive detectors, and intuitive control software form the foundation for reproducible and efficient work results.

pointSEM components at a glance

Electronics, hardware and software

pointSEM overview image new REM control
Completely new SEM control electronics and software

Based on the latest Windows version

Full network compatibility

User interface of the scanning electron microscope control software DISS6
The best image acquisition system on the market - based on DISS 6

Simultaneous signal acquisition of up to 20 analog image signals (SE, BSE, EDS, WDS, etc.)

Image resolution up to 500 MPixels

Scan speed with dwell times as low as 10 ns

Live signal mixing and processing

Versatile triggers and synchronization (Pixel/Line/Frame)

Optical sample navigation via photo (SamplePilot)

BSE Detector (optional)

Fast and highly sensitive 4-quadrant Si sensor from point electronic, optimized for BSE signal

In-situ preamplifier for optimal efficiency and speed

Low kV sensors

Automation for vacuum, gun, stage, and detectors

Automatic control

Automation of positioning and rotation

Touch Alarm for collision avoidance

Image illustrating the Brightness/Contrast automation feature in the DISS6 software for image generation in electron microscopes
Automation features for image generation

Autofocus/Stigmator and automated Brightness/Contrast

Automated Saving, e.g., for time-series imaging

Automated quantification of pixel values

REM control panels for operating an electron microscope using DISS6
New control panels for precise and rapid operation

Faster and easier control, higher efficiency 

Magnification, focus, image shift, brightness, contrast, astigmatism, etc.

Integrable into GUI or API

PC and monitor for the pointSEM scanning electron microscopes
Modern PC and monitors

State-of-the-art technology
Windows-based
Interface compatible

New wear parts

All wear parts have been replaced with new components, including covers, the cathode, and consumables such as connectors, hoses, or O-rings.

Additional add-on options

Extensions for your pointSEM


Analyse-Add-Ons

  • EDX Detector (Bruker)
  • EBSD Detector (Bruker)
  • BSE Detector
  • HT BSE Detector
  • 3D Topography system
  • 3D Calibration system
  • EA for SEM system

     


Zusatzgeräte

  • Magnetfeldkompensation (Spicer Consulting)
  • Unabhängige Stromversorgung und Überschlagschutz
  • Plasma Cleaner
  • Kompressoren
  • Umlaufkühler
  • Pumpen
  • Hochspannungsversorgung

Service-Add-Ons

  • Site Survey: Raumaufmessung inkl. Magnetfeldanalyse (mit Systemen von Spicer Consulting)
  • Wartungs- und Servicevertrag-Optionen