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pointSEM Zeiss LEO 1430VP

Key Facts

Image processing
  • Resolution: up to 23,000 × 23,000 pixels
  • Dwell time: 10 ns – 500 ms per pixel
  • Magnification range: 15 – 1,000k
  • Image shift range: ±100 µm
Resolution at WD = 8 mm and 30 kV
  • 30 kV: 3.5 nm
  • VP mode 30 kV: 5.5 nm
Emitter
  • Tungsten Filament
Accelerating voltage
  • 0.2 – 30 kV
Beam current
  • 1 pA to 1 µA (measured with Faraday cup)
Detectors
  • In-Chamber Everhart Thornley Detector (ETD): SE
  • Variable Pressure SE Detector (VPSE)
Chamber
  • Inner Diameter: 230 mm
  • Height: 190 mm
  • Width: 300 mm
  • Depth: 265 mm
Stage
  • Number of axes: 5
  • X travel: 100 mm
  • Y travel: 125 mm
  • Z travel: 35 mm
  • Z fine adjustment: 35 mm
  • Rotation: 360°
  • Tilt: 0° – 90° 

pointSEM Zeiss LEO 1430VP in detail

High-resolution images for precise analyses.

This pointSEM is based on the high-performance LEO 1430VP platform and is equipped with a tungsten field emission source. The Zeiss column has been refurbished and additionally enhanced by our state-of-the-art, powerful electronics and a versatile, high-performance control software.

The variable pressure pointSEM is designed for imaging and analysis of three-dimensional samples, especially those with irregular or uneven surfaces, such as fracture structures.

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Our pointSEM inclusive service

We support you from installation to long-term operation.


10+ years spare parts guarantee

Long-term availability of all point electronic spare parts for maximum operational reliability.


Warranty on all components

1 year warranty on our point electronic parts, 6 months on all original parts.


Delivery, including installation 

Your SEM will be fully delivered, installed, and commissioned – at no additional cost.


Ready to use immediately 

The workstation PC is fully set up and preconfigured for controlling the pointSEM.


Training for your team 

Hands-on training for safe and efficient use of the pointSEM control software.

More for your microscope

Expand the capabilities of your pointSEM with our add-ons

Magnetic field compensation by Spicer Consulting
Magnetic Field Compensation by Spicer Consulting
  • Minimizes external electromagnetic interference affecting image quality and measurement accuracy
  • Enables higher resolution, more stable images, and reproducible analysis results
Independent power supply and surge protection
  • Ensures operation during power outages
  • Protection against network fluctuations and surges
  • Reduces downtime of your pointSEM
Plasma cleaner
  • Reduces contaminations
  • Improves image quality
  • Fewer artifacts
  • More stable and reliable Measurement results, especially at high resolutions
Compressors
  • Supplies auxiliary units and infrastructure systems
  • Supports stable operation
  • Prevents operational disruptions
  • Increases system availability
Circulation cooler
  • Constant operating temperature of important system components of your pointSEM
  • Reduces temperature-related fluctuations
Vacuum pumps

We offer suitable vacuum pumps for your pointSEM: 

  • Foreline pumps 
  • Turbo pumps
Soundproofing boxes
  • Reduces noise pollution from pumps and compressors
  • Decreases disruptive vibrations for your pointSEM

More technologies for your pointSEM

Analytical add-ons

EDX by Bruker
  • Qualitative and quantitative material analyses - from Boron (5) to Californium (98)
  • Composition assessments, line scanning, spectral element mapping
EBSD by Bruker
  • Material investigations of crystallographic structures
  • Analysis of grain orientations, phase distributions, and deformation states
Premium BSE Detector
  • Fast, efficient, and versatile detector for materials science
  • Rapid imaging in sub-microseconds
  • Operation at low kV
High-Temperature BSE Detector
  • Unique light-insensitive detector for in-situ/in-operando microscopy
  • High efficiency in the low kV range
  • With water cooling
3D Topography Bundle
  • The only solution for quantitative and calibrated real-time measurement of surface heights
  • Real-time 3D visualization
  • Manufacturer-independent
3D Calibration Bundle
  • 3D calibration of your sample 
  • Determination of the accuracy of your 3D measurements
  • Quantitative evaluation of surface and height features
Electrical Analysis in the SEM
  • Visualization of electronic defects and properties (EBIC, RCI, EBIRCH)
  • Multichannel imaging, live color mixing, quantitative signal analysis, in situ preamplification, integrated lock-in EA

Precise REM analysis.

Quickly installed.

Immediately ready for use.

With your pointed Zeiss LEO 1430 VP, you receive a powerful SEM system including installation, preconfigured workstation PC, and personal support.

  • Installation and training included
  • 10+ years of spare parts availability
  • Personal contact person
     

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The performance values and data provided on this website correspond to the typical results achieved during tests in our facility under specific test conditions. They do not constitute guaranteed values for on-site use.