pointSEM Zeiss LEO 430 in Detail
High-resolution images for precise analyses.
This pointSEM is based on the high-performance LEO 430 platform and is equipped with a tungsten field emission source. The Zeiss column has been refurbished and complemented with our state-of-the-art, high-performance electronics and the powerful, versatile control software from point electronic.
Magnetic Field Compensation by Spicer Consulting
- Minimizes external electromagnetic interference on image quality and measurement accuracy
- Enables higher resolution, more stable images, and reproducible analysis results
Independent power supply and surge protection
- Ensures operation during power outages
- Protection against grid fluctuations and surges
- Reduces downtime of your pointSEM
Plasma cleaner
- Reduces contamination
- Improves image quality
- Fewer artifacts
- More stable and reliable measurement results, especially at high resolutions
Compressors
- Supplies auxiliary units and infrastructure systems
- Supports stable operation
- Prevents operational disruptions
- Increases system availability
Recirculating cooler
- Constant operating temperature of important system components of your pointSEM
- Reduces temperature-related fluctuations
Vacuum pumps
We offer suitable vacuum pumps for your pointSEM:
- Foreline pumps
- Turbo pumps
Soundproof boxes
- Reduces noise pollution from pumps and compressors
- Decreases disturbing vibrations for your pointSEM
EDX by Bruker
- Qualitative and quantitative material analyses - from boron (5) to californium (98)
- Composition evaluations, line scans, spectral element mapping
EBSD by Bruker
- Material analysis of crystallographic structures
- Analysis of grain orientations, phase distributions, and deformation states
Premium BSE Detector
- Fast, efficient, and versatile detector for materials science
- Rapid imaging in sub-microsecond range
- Operation at low kV
High-Temperature BSE Detector
- Unique, light-insensitive detector for in-situ / in-operando microscopy
- High efficiency in the low kV range
- With water cooling
3D Topography system
- The only solution for quantitative and calibrated real-time surface height measurement
- Real-time 3D visualization
- Manufacturer-independent
3D Calibration kit
- 3D calibration of your sample
- Determination of the accuracy of your 3D measurements
- Quantitative evaluation of surface and height features
Electrical Analysis in SEM
- Visualization of electronic defects and properties (EBIC, RCI, EBIRCH)
- Multichannel imaging, live color mixing, quantitative signal analysis, in-situ preamplification, integrated lock-in EA
